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![Testing Complex and Embedded Systems by Jon M. Quigley, Kim H. Pries](https://558130.bdp32.group/rails/active_storage/representations/redirect/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaHBBNFBNb1E9PSIsImV4cCI6bnVsbCwicHVyIjoiYmxvYl9pZCJ9fQ==--738d8f7c405eeb4fd79821351a25d161b67ee17a/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaDdCem9MWm05eWJXRjBTU0lJYW5CbkJqb0dSVlE2RkhKbGMybDZaVjkwYjE5c2FXMXBkRnNIYVFJc0FXa0M5QUU9IiwiZXhwIjpudWxsLCJwdXIiOiJ2YXJpYXRpb24ifX0=--038335c90cf75c275ae4d36968ac417dc4a0a3e3/Testing%20Complex%20and%20Embedded%20Systems.jpg)
287 pages • missing pub info (editions)
ISBN/UID: 9781439821404
Format: Hardcover
Language: English
Publisher: CRC Press
Publication date: 08 December 2010
Description
Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just befo...
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![Testing Complex and Embedded Systems by Jon M. Quigley, Kim H. Pries](https://558130.bdp32.group/rails/active_storage/representations/redirect/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaHBBNFBNb1E9PSIsImV4cCI6bnVsbCwicHVyIjoiYmxvYl9pZCJ9fQ==--738d8f7c405eeb4fd79821351a25d161b67ee17a/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaDdCem9MWm05eWJXRjBTU0lJYW5CbkJqb0dSVlE2RkhKbGMybDZaVjkwYjE5c2FXMXBkRnNIYVFJc0FXa0M5QUU9IiwiZXhwIjpudWxsLCJwdXIiOiJ2YXJpYXRpb24ifX0=--038335c90cf75c275ae4d36968ac417dc4a0a3e3/Testing%20Complex%20and%20Embedded%20Systems.jpg)
287 pages • missing pub info (editions)
ISBN/UID: 9781439821404
Format: Hardcover
Language: English
Publisher: CRC Press
Publication date: 08 December 2010
Description
Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just befo...