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![Thermal Testing of Integrated Circuits by Antonio Rubio, J. Altet](https://558130.bdp32.group/rails/active_storage/representations/redirect/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaHBBN3lyWlE9PSIsImV4cCI6bnVsbCwicHVyIjoiYmxvYl9pZCJ9fQ==--dde04d33d7f216ee5aa4c3bb9c8989fc713ea8ed/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaDdCem9MWm05eWJXRjBTU0lJYW5CbkJqb0dSVlE2RkhKbGMybDZaVjkwYjE5c2FXMXBkRnNIYVFJc0FXa0M5QUU9IiwiZXhwIjpudWxsLCJwdXIiOiJ2YXJpYXRpb24ifX0=--038335c90cf75c275ae4d36968ac417dc4a0a3e3/Thermal%20Testing%20of%20Integrated%20Circuits.jpg)
204 pages • missing pub info (editions)
ISBN/UID: 9781441952875
Format: Paperback
Language: English
Publisher: Springer
Publication date: 21 September 2011
Description
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of th...
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![Thermal Testing of Integrated Circuits by Antonio Rubio, J. Altet](https://558130.bdp32.group/rails/active_storage/representations/redirect/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaHBBN3lyWlE9PSIsImV4cCI6bnVsbCwicHVyIjoiYmxvYl9pZCJ9fQ==--dde04d33d7f216ee5aa4c3bb9c8989fc713ea8ed/eyJfcmFpbHMiOnsibWVzc2FnZSI6IkJBaDdCem9MWm05eWJXRjBTU0lJYW5CbkJqb0dSVlE2RkhKbGMybDZaVjkwYjE5c2FXMXBkRnNIYVFJc0FXa0M5QUU9IiwiZXhwIjpudWxsLCJwdXIiOiJ2YXJpYXRpb24ifX0=--038335c90cf75c275ae4d36968ac417dc4a0a3e3/Thermal%20Testing%20of%20Integrated%20Circuits.jpg)
204 pages • missing pub info (editions)
ISBN/UID: 9781441952875
Format: Paperback
Language: English
Publisher: Springer
Publication date: 21 September 2011
Description
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of th...